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smartctl 5.39.1 2010-01-28 r3054 [i686-pc-mingw32-xp-sp3] (sf-win32-5.39.1-1)
Copyright (C) 2002-10 by Bruce Allen, hxxp://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family: Fujitsu MHZ2 BH series
Device Model: FUJITSU MHZ2320BH G2
Serial Number: K60LT8C2JWKH
Firmware Version: 00000009
User Capacity: 320.072.933.376 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 3f
Local Time is: Sun Nov 28 17:38:19 2010 WN
SMART support is: Available - device has SMART capability.
Enabled status cached by OS, trying SMART RETURN STATUS cmd.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (1298) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 184) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 046 Pre-fail Always - 101072
2 Throughput_Performance 0x0005 100 100 030 Pre-fail Offline - 57540608
3 Spin_Up_Time 0x0003 100 100 025 Pre-fail Always - 1
4 Start_Stop_Count 0x0032 099 099 000 Old_age Always - 916
5 Reallocated_Sector_Ct 0x0033 100 100 024 Pre-fail Always - 0 (2000, 0)
7 Seek_Error_Rate 0x000f 100 100 047 Pre-fail Always - 517
8 Seek_Time_Performance 0x0005 100 100 019 Pre-fail Offline - 0
9 Power_On_Hours 0x0032 096 096 000 Old_age Always - 2318
10 Spin_Retry_Count 0x0013 100 100 020 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 913
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 27
193 Load_Cycle_Count 0x0032 099 099 000 Old_age Always - 23262
194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 36 (Lifetime Min/Max 13/57)
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 133
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0 (0, 6898)
197 Current_Pending_Sector 0x0012 099 099 000 Old_age Always - 2
198 Offline_Uncorrectable 0x0010 099 099 000 Old_age Offline - 2
199 UDMA_CRC_Error_Count 0x003e 200 253 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000f 100 100 060 Pre-fail Always - 3358
203 Run_Out_Cancel 0x0002 100 100 000 Old_age Always - 2632786969286
240 Head_Flying_Hours 0x003e 200 200 000 Old_age Always - 0

SMART Error Log Version: 1
ATA Error Count: 452 (device log contains only the most recent five errors)
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 452 occurred at disk power-on lifetime: 2314 hours (96 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
01 51 06 f1 0b da e0 Error: AMNF 6 sectors at LBA = 0x00da0bf1 = 14289905

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 ef 0b da e0 00 02:23:19.113 READ DMA EXT
25 00 08 e7 0b da e0 00 02:23:19.113 READ DMA EXT
25 00 08 df 0b da e0 00 02:23:19.113 READ DMA EXT
25 00 08 d7 0b da e0 00 02:23:19.113 READ DMA EXT
25 00 01 00 00 00 e0 00 02:23:19.112 READ DMA EXT

Error 451 occurred at disk power-on lifetime: 2314 hours (96 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 56 f1 0b da e0 Error: UNC 86 sectors at LBA = 0x00da0bf1 = 14289905

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 c7 0b da e0 00 02:23:14.194 READ DMA EXT
25 00 80 0f 6f 53 e0 00 02:23:14.192 READ DMA EXT
25 00 80 8f 6e 53 e0 00 02:23:14.191 READ DMA EXT
25 00 80 0f 6e 53 e0 00 02:23:14.190 READ DMA EXT
25 00 80 8f 6d 53 e0 00 02:23:14.189 READ DMA EXT

Error 450 occurred at disk power-on lifetime: 2314 hours (96 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 07 78 0f 0e e0 Error: UNC 7 sectors at LBA = 0x000e0f78 = 921464

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 77 0f 0e e0 00 02:13:42.964 READ DMA EXT
25 00 08 6f 0f 0e e0 00 02:13:42.964 READ DMA EXT
25 00 08 67 0f 0e e0 00 02:13:42.964 READ DMA EXT
25 00 08 5f 0f 0e e0 00 02:13:42.963 READ DMA EXT
25 00 08 57 0f 0e e0 00 02:13:42.963 READ DMA EXT

Error 449 occurred at disk power-on lifetime: 2314 hours (96 days + 10 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 3f 78 0f 0e e0 Error: UNC 63 sectors at LBA = 0x000e0f78 = 921464

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 80 37 0f 0e e0 00 02:13:38.128 READ DMA EXT
25 00 80 b7 0e 0e e0 00 02:13:38.127 READ DMA EXT
25 00 10 a7 0e 0e e0 00 02:13:38.116 READ DMA EXT
25 00 58 37 a9 aa e0 00 02:13:38.115 READ DMA EXT
25 00 80 b7 a8 aa e0 00 02:13:38.101 READ DMA EXT

Error 448 occurred at disk power-on lifetime: 2307 hours (96 days + 3 hours)
When the command that caused the error occurred, the device was active or idle.

After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 06 f1 0b da e0 Error: UNC 6 sectors at LBA = 0x00da0bf1 = 14289905

Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
25 00 08 ef 0b da e0 00 00:15:25.449 READ DMA EXT
35 00 08 47 00 5e e0 00 00:15:25.449 WRITE DMA EXT
25 00 01 00 00 00 e0 00 00:15:25.448 READ DMA EXT
35 00 08 d7 21 91 e0 00 00:15:25.448 WRITE DMA EXT
25 00 80 47 0c da e0 00 00:15:25.447 READ DMA EXT

SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.